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Publication details

Publication CODE Title
IEC TS 62215-2:2007 (2007-09) INTEGRATED CIRCUITS - MEASUREMENT OF IMPULSE IMMUNITY - PART 2: SYNCHRONOUS TRANSIENT INJECTION METHOD
 
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Description
Contains general information and definitions on the test method to evaluate the immunity of integrated circuits (ICs) against fast conducted synchronous transient disturbances.The objective is to describe general conditions to obtain a quantitative measure of immunity of ICs establishing a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this specification should be explicitly noted in the individual test report. This synchronous transient immunity measurement method uses short impulses with fast rise times of different amplitude, duration and polarity in a conductive mode to the IC. In this method, the applied impulse has to be synchronized with the activity of the IC to make sure that controlled and reproducible conditions can be assured
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version

Status
Status TECHNICAL SPECIFICATION
Situation Currently active
Origin
Committee TC 47/SC 47A
INTEGRATED CIRCUITS
Responsible Ir DELENS Marc
Approval
BEC Approval 2007-09-10
ICS-Code (International Standards Classification) 31.200
IEC publication date 2007-09-10
IEC stability date 2022-12-31
IEC last modification date 2018-07-10