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Publication details

Publication CODE Title
IEC 62374:2007 (2007-03) SEMICONDUCTOR DEVICES - TIME DEPENDENT DIELECTRIC BREAKDOWN (TDDB) TEST FOR GATE DIELECTRIC FILMS
 
Price Excl. VAT Total number of pages, tables and drawings
159.00 € 43.
Description
Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2007-03-29
ICS-Code (International Standards Classification) 31.080.99
IEC publication date 2007-03-29
IEC stability date 2025-12-31
IEC last modification date 2018-11-22