| Publication CODE |
Title |
| IEC 60747-5-11:2019 (2019-12) |
SEMICONDUCTOR DEVICES - PART 5-11: OPTOELECTRONIC DEVICES - LIGHT EMITTING DIODES - TEST METHOD OF RADIATIVE AND NONRADIATIVE CURRENTS OF LIGHT EMITTING DIODES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
13. |
Description
IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2019-12-11 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2019-12-11 |
| IEC stability date |
2025-12-31 |
| IEC file modification date |
2019-12-11 |
| IEC last modification date |
2019-12-20 |
|
