Account:  - Login  |  Webstore  |  Shopping basket cart
English  |  Français  |  Nederlands

Publication details

Publication CODE Title
IEC 61649:1997 (1997-05) GOODNESS-OF-FIT TESTS, CONFIDENCE INTERVALS AND LOWER CONFIDENCE LIMITS FOR WEIBULL DISTRIBUTED DATA
 
Price Excl. VAT Total number of pages, tables and drawings
85.00 € 31.
Description
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 61649:2008
Origin
Committee TC 56
DEPENDABILITY
Responsible Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building Bd Auguste Reyers, 80
1030  BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
Approval
BEC Approval 1997-05-16
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 1997-05-16
IEC last modification date 2008-08-13