| Publication CODE |
Title |
| IEC 60147-4:1976 (1976-01) |
ESSENTIAL RATINGS AND CHARACTERISTICS OF SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS - PART 4: ACCEPTANCE AND RELIABILITY |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
39. |
Description
Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for each device category. This permits a unique and easy comparison of data presented by different manufacturers, relative to acceptance testing as well as to reliability testing.
Deals with semiconductor devices and digital integrated circuits (bipolar, MOS, multi-chip and hybrid circuits).
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
1976-01-01 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
1976-01-01 |
| IEC last modification date |
2013-07-03 |
|
