| Publication CODE |
Title |
| IEC 60679-6:2011 (2011-03) |
QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 6: PHASE JITTER MEASUREMENT METHOD FOR QUARTZ CRYSTAL OSCILLATORS AND SAW OSCILLATORS - APPLICATION GUIDELINES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
42 P.. |
Description
IEC 60679-6:2011 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to 1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. This standard cancels and replaces IEC/PAS 60679-6 published in 2008. This first edition constitutes a technical revision.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 49
SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION
|
| Responsible |
Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building
Bd Auguste Reyers, 80
1030
BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
|
| BEC Approval |
2011-03-14 |
| Registration |
115482 |
| ICS-Code (International Standards Classification) |
31.140
|
| NBN Status |
New |
|
| IEC publication date |
2011-03-14 |
| IEC stability date |
2018-02-09 |
| IEC last modification date |
2018-02-14 |
|
