| Publication CODE |
Title |
| IEC 63003:2015 (2015-12) |
STANDARD FOR THE COMMON TEST INTERFACE PIN MAP CONFIGURATION FOR HIGH-DENSITY, SINGLE-TIER ELECTRONICS TEST REQUIREMENTS UTILIZING IEEE STD 1505™ |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
424.00 €
|
162 P.. |
Description
IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 91
ELECTRONICS ASSEMBLY TECHNOLOGY
|
| Responsible |
De heer VAN HECKE Luk
|
| BEC Approval |
2015-12-14 |
| ICS-Code (International Standards Classification) |
25.040.01
|
| NBN Status |
New |
|
| IEC publication date |
2015-12-14 |
| IEC stability date |
2021-12-31 |
| IEC file modification date |
2015-12-15 |
| IEC last modification date |
2016-12-08 |
|
