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Publication details

Publication CODE Title
IEC 62951-4:2019 (2019-02) SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 4: FATIGUE EVALUATION FOR FLEXIBLE CONDUCTIVE THIN FILM ON THE SUBSTRATE FOR FLEXIBLE SEMICONDUCTOR DEVICES
 
Price Excl. VAT Total number of pages, tables and drawings
85.00 € 26.
Description
IEC 62951-4:2019 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices. The films include any films deposited or bonded onto a non-conductive flexible substrate such as thin metal film, transparent conducting electrode, and thin silicon film used for flexible semiconductor devices. The electrical and mechanical behaviours of films on the substrate are evaluated. The fatigue test methods include dynamic bending fatigue test and static bending fatigue test.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2019-02-27
ICS-Code (International Standards Classification) 31.080.99
NBN Status New
IEC publication date 2019-02-27
IEC stability date 2023-12-31
IEC file modification date 2019-02-27
IEC last modification date 2019-02-27