Publication details
| Publication CODE |
Title |
| NBN EN 60749-44:2016 (2016-10) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES |
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| Price Excl. VAT |
Total number of pages, tables and drawings |
|
25.00 €
|
2 P.. |
Description
IEC 60749-44:2016 establishes a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays. The single event effects sensitivity is measured while the device is irradiated in a neutron beam of known flux. This test method can be applied to any type of integrated circuit.
NOTE 1 - Semiconductor devices under high voltage stress can be subject to single event effects including SEB, single event burnout and SEGR single event gate rupture, for this subject which is not covered in this document, please refer to IEC 62396-4.
NOTE 2 - In addition to the high energy neutrons some devices can have a soft error rate due to low energy (<1 eV) thermal neutrons. For this subject which is not covered in this document, please refer to IEC 62396-5.
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| Class |
C
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Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 60749-44:2016.
For the series NBN EN 50XXX, the standards are however complete.
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DE version
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EN version
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FR version
|
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Status
| Status |
Registered trilingual Belgian standard EN or FR or DE |
| Situation |
Currently active
|
|
Origin
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
Approval
| BEC Approval |
2016-08-25 |
| NBN Approval |
2016-11-23 |
| Registration |
168264 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2016-08-25 |
| Date of availability (d.a.v.) |
2016-10-21 |
| Date of announcement (d.o.a.) |
2016-11-25 |
| Date of publication (d.o.p.) |
2017-05-25 |
| Date of withdrawal former edition (d.o.w.) |
2019-08-25 |
|
Correspondences with international standards
| Relation |
International standard |
Date |
| is identical to |
EN 60749-44:2016
|
2016-10-21 |
| is identical to |
IEC 60749-44:2016/ed. 1.0
|
2016-07-21 |
|
