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Publication details

Publication CODE Title
IEC 60147-2K:1978 (1978-01) SUPPLEMENT K - ESSENTIAL RATINGS AND CHARACTERISTICS OF SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS - PART 2: GENERAL PRINCIPLES OF MEASURING METHODS
 
Price Excl. VAT Total number of pages, tables and drawings
201.00 € 55 P.
Description
Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer diodes, i.e. in addition to measurement of d.c. parameters, those of rectified current, intermediate frequency impedance, voltage standing wave ratio, overall noise factor, output noise ratio, conversion loss, burnout energy.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version
Status
Status IEC PUBLICATION
Situation Withdrawn
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 1978-01-01
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 1978-01-01
IEC last modification date 2013-07-03