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Publication details

Publication CODE Title
IEC PAS 62165:2000 (2000-08) GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GAAS FETS
 
Price Excl. VAT Total number of pages, tables and drawings
42.00 € 10.
Description
For power GaAs FET applications requiring high reliability an accurate measurement of thermal resistance is extremely important to provide the user with knowledge of the FET's operating temperature so that more accurate life estimates can be made. FET failure mechanism and failure rates have in general, an exponential dependence on temperature.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version

Status
Status IEC PUBLICATION
Situation Withdrawn
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2000-08-22
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 2000-08-22
IEC last modification date 2004-05-17