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Publication details

Publication CODE Title
IEC 60749-4:2017 (2017-03) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
 
Price Excl. VAT Total number of pages, tables and drawings
42.00 € 9 P..
Description
IEC 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes the following significant technical changes with respect to the previous edition:
a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1;
b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;
c) allowance of additional time-to-test delay or return-to-stress delay.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version

Status
Status IEC PUBLICATION
Situation Currently active
Replaces  IEC 60749-4:2002
Replaces  IEC 60749-4:2002/COR1:2003
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2017-03-03
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
IEC publication date 2017-03-03
IEC stability date 2022-12-31
IEC file modification date 2017-03-03
IEC last modification date 2019-09-20