Publication CODE |
Title |
IEC 60749-17:2019 (2019-03) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
42.00 €
|
17. |
Description
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
- updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
- addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2019-03-28 |
ICS-Code (International Standards Classification) |
31.080.01
|
NBN Status |
New |
|
IEC publication date |
2019-03-28 |
IEC stability date |
2022-12-31 |
IEC file modification date |
2019-03-28 |
IEC last modification date |
2019-03-28 |
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