| Publication CODE |
Title |
| IEC 63364-1:2022 (2022-12) |
SEMICONDUCTOR DEVICES - SEMICONDUCTOR DEVICES FOR IOT SYSTEM - PART 1: TEST METHOD OF SOUND VARIATION DETECTION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
24. |
Description
IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2022-12-14 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2022-12-14 |
| IEC stability date |
2027-12-31 |
| IEC file modification date |
2022-12-14 |
| IEC last modification date |
2022-12-14 |
|
