| Publication CODE |
Title |
| IEC 60147-2K:1978 (1978-01) |
SUPPLEMENT K - ESSENTIAL RATINGS AND CHARACTERISTICS OF SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS -
PART 2: GENERAL PRINCIPLES OF MEASURING METHODS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
201.00 €
|
55 P. |
Description
Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer diodes, i.e. in addition to measurement of d.c. parameters, those of rectified current, intermediate frequency impedance, voltage standing wave ratio, overall noise factor, output noise ratio, conversion loss, burnout energy.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
1978-01-01 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
1978-01-01 |
| IEC last modification date |
2013-07-03 |
|
