| Publication CODE |
Title |
| IEC PAS 62202:2000 (2000-11) |
FAILURE MECHANISMS AND MODELS FOR SILICON SEMICONDUCTOR DEVICES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
249.00 €
|
35. |
Description
Provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum-of-the-Failure-Rates method.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-11-28 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-11-28 |
| IEC last modification date |
2004-05-17 |
|
