Publication CODE |
Title |
IEC TS 62916:2017 (2017-04) |
PHOTOVOLTAIC MODULES - BYPASS DIODE ELECTROSTATIC DISCHARGE SUSCEPTIBILITY TESTING |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
85.00 €
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13. |
Description
IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
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Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
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Status |
IEC PUBLICATION |
Situation |
Currently active
|
|
Committee |
TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
|
Responsible |
De heer VAN HECKE Luk
|
BEC Approval |
2017-04-10 |
ICS-Code (International Standards Classification) |
27.160
|
NBN Status |
New |
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IEC publication date |
2017-04-10 |
IEC stability date |
2026-12-31 |
IEC file modification date |
2017-04-10 |
IEC last modification date |
2019-12-11 |
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