| Publication CODE |
Title |
| IEC 60749-24:2004 (2004-03) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
19. |
Description
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2004-03-21 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2004-03-09 |
| IEC stability date |
2025-12-31 |
| IEC last modification date |
2018-01-11 |
|
