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Publication details

Publication CODE Title
IEC 62951-8:2023 (2023-01) SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 8: TEST METHOD FOR STRETCHABILITY, FLEXIBILITY, AND STABILITY OF FLEXIBLE RESISTIVE MEMORY
 
Price Excl. VAT Total number of pages, tables and drawings
71.00 € 14.
Description
IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2023-01-19
ICS-Code (International Standards Classification) 31.080.99
NBN Status New
IEC publication date 2023-01-19
IEC stability date 2026-12-31
IEC file modification date 2023-01-19
IEC last modification date 2023-01-19