Publication details

Publication CODE	Title
IEC 60747-5-3:1997+AMD1:2002 CSV (2009-11)	DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS

Price Excl. VAT	Total number of pages, tables and drawings
408.00 €	86 P.

Description
IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (2002). Therefore, no need to order amendment in addition to this publication.

This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.

Class

C990 (IEC PUBLICATIONS IEC PUBLICATIONS)

Available files

EN/FR version

Status

Status	IEC PUBLICATION
Situation	Withdrawn Partly replaced by IEC 60747-5-4:2006 Partly replaced by IEC 60747-5-5:2007 Partly replaced by IEC 60747-5-6:2016 Partly replaced by IEC 60747-5-7:2016 Replaced by IEC 60747-5-4:2006 Replaced by IEC 60747-5-5:2007 Replaced by IEC 60747-5-7:2016 Replaced by IEC 60747-5-6:2016

Origin

Committee	TC 47/SC 47E DISCRETE SEMICONDUCTOR DEVICES
Responsible	Ir DELENS Marc

Approval

BEC Approval	2009-11-25
Registration	115202
ICS-Code (International Standards Classification)	31.080.99
NBN Status	New

IEC publication date	2009-11-25
IEC stability date	2013-12-31
IEC last modification date	2017-08-23