| Publication CODE |
Title |
| IEC 60747-11:1985 (1985-01) |
SEMICONDUCTOR DEVICES. DISCRETE DEVICES. PART 11: SECTIONAL
SPECIFICATION FOR DISCRETE DEVICES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
35. |
Description
Applies to discrete semiconductor devices, excluding optoelectronic
devices. Should be read together with the generic specification to
which it refers: it gives details of the Quality Assessment
Procedures, the inspection requirements, screening sequences,
sampling requirements, test and measurement procedures required for
the assessment of semiconductor devices.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
1985-01-01 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
1985-01-01 |
| IEC stability date |
2015-12-31 |
| IEC last modification date |
2016-01-04 |
|
