| Publication CODE |
Title |
| IEC 60749-17:2019 (2019-03) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
17. |
Description
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
- updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
- addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2019-03-28 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2019-03-28 |
| IEC stability date |
2022-12-31 |
| IEC file modification date |
2019-03-28 |
| IEC last modification date |
2019-03-28 |
|
