| Publication CODE |
Title |
| IEC 60749-23:2004 (2004-02) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 23: HIGH TEMPERATURE OPERATING LIFE |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
17. |
Description
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2004-02-23 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2004-02-23 |
| IEC stability date |
2025-12-31 |
| IEC last modification date |
2018-01-11 |
|
