| Publication CODE |
Title |
| IEC 62416:2010 (2010-04) |
SEMICONDUCTOR DEVICES - HOT CARRIER TEST ON MOS TRANSISTORS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
20 P. |
Description
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2010-04-26 |
| Registration |
106125 |
| ICS-Code (International Standards Classification) |
31.080.30
|
| NBN Status |
New |
|
| IEC publication date |
2010-04-26 |
| IEC stability date |
2025-12-31 |
| IEC last modification date |
2018-11-22 |
|
