| Publication CODE |
Title |
| IEC PAS 62184:2000 (2000-08) |
LEAD INTEGRITY TEST METHOD |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
16. |
Description
Provides various tests for determining the integrity lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for reassembly.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-08-22 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-08-22 |
| IEC last modification date |
2003-08-07 |
|
