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Publication details

Publication CODE Title
IEC 60747-5-8:2019 (2019-11) SEMICONDUCTOR DEVICES - PART 5-8: OPTOELECTRONIC DEVICES - LIGHT EMITTING DIODES - TEST METHOD OF OPTOELECTRONIC EFFICIENCIES OF LIGHT EMITTING DIODES
 
Price Excl. VAT Total number of pages, tables and drawings
106.00 € 36.
Description
IEC 60747-5-8:2019 specifies the terminology and the measuring methods of various efficiencies of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this part of IEC 60747. The efficiencies whose measuring methods are defined in this part are the power efficiency (PE), the external quantum efficiency (EQE), the voltage efficiency (VE), and the light extraction efficiency (LEE). To measure the LEE, the measurement data of the internal quantum efficiency (IQE) is used, whose measuring method is discussed in IEC 60747-5-9 and IEC 60747-5-10. The injection efficiency (IE) and the radiative efficiency (RE) are given definitions only.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2019-11-13
ICS-Code (International Standards Classification) 31.080.99
NBN Status New
IEC publication date 2019-11-13
IEC stability date 2024-12-31
IEC file modification date 2019-11-13
IEC last modification date 2019-11-13