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Publication details

Publication CODE Title
IEC 60747-5-4:2022 (2022-04) SEMICONDUCTOR DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS
 
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206.00 € 33.
Description
IEC 60747-5-4:2022(E) specifies the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
This edition includes the following significant technical changes with respect to the previous edition:
  1. References for the terms and definitions related to the lighting area, IEC 60050-845, are revised based on IEC 60050-845:2020;
  2. Emission angle is changed to radiation angle in 3.3.2;
  3. Definitions of rise time and fall time in 3.4.1 are revised based on the publication IEC 60050-521:2002;
  4. Spectral linewidth is added to Table 1 in Clause 4;
  5. Conditions for carrier-to-noise ratio of Table 1 in Clause 4 is amended.
  6. Error in the equation for carrier-to-noise ratio in 5.2.2 is corrected;
  7. Precaution against the equipment used for carrier-to-noise ratio measurement is added in 5.2.2;
  8. Explanation for the measurement method of the small signal cut-off frequency in 5.3.2 of the first edition is deleted because it has been defined in the latest version of ISO 11554;
  9. Reference document for the lifetime in 5.4 is amended;
  10. Precaution against the measuring arrangement used for the half-intensity width and 1/e2-intensity is added in 5.5.3;
  11. Reference tables in Annex A, Annex B and Annex C are revised by following the latest version of ISO publications.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version

Status
Status IEC PUBLICATION
Situation Currently active
Replaces  IEC 60747-5-4:2006
Origin
Committee TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2022-04-27
ICS-Code (International Standards Classification) 31.080.01 , 31.260
NBN Status New
IEC publication date 2022-04-27
IEC stability date 2026-12-31
IEC file modification date 2022-04-27
IEC last modification date 2022-04-27