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Publication details

Publication CODE Title
IEC 60747-5-3:1997+AMD1:2002 CSV (2009-11) DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS
 
Price Excl. VAT Total number of pages, tables and drawings
355.00 € 86 P.
Description
IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (2002). Therefore, no need to order amendment in addition to this publication.

This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Partly replaced by  IEC 60747-5-4:2006
Partly replaced by  IEC 60747-5-5:2007
Partly replaced by  IEC 60747-5-6:2016
Partly replaced by  IEC 60747-5-7:2016
Replaced by  IEC 60747-5-4:2006
Replaced by  IEC 60747-5-5:2007
Replaced by  IEC 60747-5-7:2016
Replaced by  IEC 60747-5-6:2016
Origin
Committee TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2009-11-25
Registration 115202
ICS-Code (International Standards Classification) 31.080.99
NBN Status New
IEC publication date 2009-11-25
IEC stability date 2013-12-31
IEC last modification date 2017-08-23