Publication CODE |
Title |
IEC PAS 62204:2000 (2000-11) |
STANDARD METHOD FOR MEASURING AND USING THE TEMPERATURE COEFFICIENT OF RESISTANCE TO DETERMINE THE TEMPERATURE OF A METALLIZATION LINE |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
159.00 €
|
25. |
Description
Aims at determining the temperature coefficient of resistance (at a given reference temperature) of aluminium and aluminium-alloy thin-film metallization that are used in microelectronic circuits and devices.
This method is intended for estimating a mean temperature of a metallization line stressed in an accelerated electromigration stress test before any irreversible change in resistivity occurs due to the current-density and temperature stresses imposed.
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Status |
IEC PUBLICATION |
Situation |
Withdrawn
|
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2000-11-28 |
ICS-Code (International Standards Classification) |
35.040
|
NBN Status |
New |
|
IEC publication date |
2000-11-28 |
IEC last modification date |
2004-05-17 |
|