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Publication details

Publication CODE Title
IEC 60749-23:2004 (2004-02) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 23: HIGH TEMPERATURE OPERATING LIFE
 
Price Excl. VAT Total number of pages, tables and drawings
42.00 € 17.
Description
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Replaces  IEC PAS 62189:2000
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2004-02-23
ICS-Code (International Standards Classification) 31.080.01
IEC publication date 2004-02-23
IEC stability date 2025-12-31
IEC last modification date 2018-01-11