| Publication CODE |
Title |
| IEC 62374:2007 (2007-03) |
SEMICONDUCTOR DEVICES - TIME DEPENDENT DIELECTRIC BREAKDOWN (TDDB) TEST FOR GATE DIELECTRIC FILMS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
43. |
Description
Provides a test method of Time Dependent Dielectric Breakdown
(TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2007-03-29 |
| ICS-Code (International Standards Classification) |
31.080.99
|
|
| IEC publication date |
2007-03-29 |
| IEC stability date |
2025-12-31 |
| IEC last modification date |
2018-11-22 |
|
