| Publication CODE |
Title |
| IEC PAS 62483:2006 (2006-09) |
TEST METHOD FOR MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
201.00 €
|
27. |
Description
Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2006-09-12 |
| ICS-Code (International Standards Classification) |
35.040
|
|
| IEC publication date |
2006-09-12 |
| IEC stability date |
2012-12-31 |
| IEC last modification date |
2013-09-25 |
|
