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Publication details

Publication CODE Title
NBN EN 60749-29:2011 (2011-08) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS PART 29: LATCH-UP TEST
 
Price Excl. VAT Total number of pages, tables and drawings
25.00 € 2 P.
Description
Covers the I-test and the overvoltage latch-up testing of integrated circuits. This test is classified as destructive. The purpose of this test is to establish a method for determining integrated circuit (IC) latchup characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established. The classification of latch-up as a function of temperature is defined in 3.1 and the failure level criteria are defined in 3.2
Class  C86  (ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally only available in English or French. Only the cover page is translated and the document itself is in English or in French.

Very important notice: 98% of the text of the NBN EN 55XXX, NBN EN 6XXXX comes from the IEC text which is NOT included. This text can be ordered here: IEC 60749-29:2011. For the series NBN EN 50XXX, the standards are however complete.

EN version
FR version
DE version
Status
Status Registered trilingual Belgian standard EN or FR or DE
Situation Currently active
Replaces  NBN EN 60749-29:2005
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2011-05-12
NBN Approval 2011-10-21
Belgian Official Journal 2011-11-29
Registration 116973
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
Date of ratification (d.o.r.) 2011-05-12
Date of availability (d.a.v.) 2011-08-19
Date of announcement (d.o.a.) 2011-08-12
Date of publication (d.o.p.) 2012-02-12
Date of withdrawal former edition (d.o.w.) 2014-05-12
Correspondences with international standards
Relation International standard Date
is identical to EN 60749-29:2011 2011-08-19
is identical to IEC 60749-29:2011/ed. 2.0 2011-04-07