| Publication CODE |
Title |
| IEC 60749-3:2002 (2002-04) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL INSPECTION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
11.00 €
|
7. |
Description
Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types.
The contents of the corrigendum of August 2003 have been included in this copy.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2002-04-09 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2002-04-09 |
| IEC stability date |
2016-12-31 |
| IEC last modification date |
2017-03-03 |
|
