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Publication details

Publication CODE Title
IEC 60749:1984 (1984-12) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS.
 
Price Excl. VAT Total number of pages, tables and drawings
201.00 € 59.
Description
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version
Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 60749:1996
Replaces  IEC 60147-5:1977
Replaces  IEC 60147-5A:1981
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 1984-12-30
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 1984-12-30
IEC last modification date 2011-07-11