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Publication details

Publication CODE Title
NBN EN 62047-13:2012 (2012-04) SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES PART 13: BEND - AND SHEAR - TYPE TEST METHODS OF MEASURING ADHESIVE STRENGTH FOR MEMS STRUCTURES
 
Price Excl. VAT Total number of pages, tables and drawings
25.00 € 3 P.
Description
Specifies the adhesive testing method between micro-sized elements and a substrate using the columnar shape of the specimens. This international standard can be applied to adhesive strength measurement of microstructures, prepared on a substrate, with width and thickness of 1 µm to 1 mm, respectively. Micro-sized elements of MEMS devices are made up of laminated fine pattern films on a substrate, which are fabricated by deposition, plating, and/or coating with photolithography. MEMS devices include a large number of interfaces between dissimilar materials, at which delamination occasionally occurs during fabrication or in operation. Combination of the materials at the junction determines the adhesive strength; moreover, defects and residual stress in the vicinity of the interface, which are changing by processing condition, strongly affect the adhesive strength. This standard specifies the adhesive testing method for microsized-elements in order to optimally select materials and processing conditions for MEMS devices. This standard does not particularly restrict test piece material, test piece size and performance of the measuring device, since the materials and size of MEMS device components range widely and testing machine for micro-sized materials has not been generalized.
Class  C96  (TELECOMMUNICATIONS - ELECTRONIC MICRO ELECTRONICS - DISCRETE SEMICONDUCTOR DEVICES)
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally only available in English or French. Only the cover page is translated and the document itself is in English or in French.

Very important notice: 98% of the text of the NBN EN 55XXX, NBN EN 6XXXX comes from the IEC text which is NOT included. This text can be ordered here: IEC 62047-13:2012. For the series NBN EN 50XXX, the standards are however complete.

EN version
FR version
DE version
Status
Status Registered trilingual Belgian standard EN or FR or DE
Situation Currently active
Origin
Committee TC 47/SC 47F
MICRO-ELECTROMECHANICAL SYSTEMS
Responsible Ir DELENS Marc
Approval
BEC Approval 2012-04-03
NBN Approval 2012-06-29
Belgian Official Journal 2012-08-29
Registration 127963
ICS-Code (International Standards Classification) 31.080.99
NBN Status New
Date of ratification (d.o.r.) 2012-04-03
Date of availability (d.a.v.) 2012-04-06
Date of announcement (d.o.a.) 2012-07-03
Date of publication (d.o.p.) 2013-01-03
Date of withdrawal former edition (d.o.w.) 2015-04-03
Correspondences with international standards
Relation International standard Date
is identical to EN 62047-13:2012 2012-04-06
is identical to IEC 62047-13:2012/ed. 1.0 2012-02-28
Relations to belgian/foreign publications
Type Origin Code Date
Standard Belgium NBN EN 62047-2