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Publication details

Publication CODE Title
IEC TS 62804-2:2022 (2022-03) PHOTOVOLTAIC (PV) MODULES - TEST METHODS FOR THE DETECTION OF POTENTIAL-INDUCED DEGRADATION - PART 2: THIN-FILM
 
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Description
IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID.
This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
Responsible De heer VAN HECKE Luk
Approval
BEC Approval 2022-03-29
ICS-Code (International Standards Classification) 27.160
NBN Status New
IEC publication date 2022-03-29
IEC stability date 2025-12-31
IEC file modification date 2022-03-29
IEC last modification date 2022-03-29