| Publication CODE |
Title |
| IEC 60749-41:2020 (2020-07) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 41: STANDARD RELIABILITY TESTING METHODS OF NON-VOLATILE MEMORY DEVICES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
44. |
Description
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2020-07-22 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2020-07-22 |
| IEC stability date |
2027-12-31 |
| IEC file modification date |
2020-07-22 |
| IEC last modification date |
2020-07-22 |
|
