| Publication CODE |
Title |
| IEC 60749-7:2002 (2002-04) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
21.00 €
|
15. |
Description
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
The contents of the corrigendum of August 2003 have been included in this copy.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2002-04-09 |
| ICS-Code (International Standards Classification) |
35.040
|
|
| IEC publication date |
2002-04-09 |
| IEC last modification date |
2011-06-17 |
|
