| Publication CODE |
Title |
| IEC PAS 62189:2000 (2000-11) |
BIAS LIFE |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
21.00 €
|
6. |
Description
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-11-28 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-11-28 |
| IEC last modification date |
2004-07-15 |
|
