| Publication CODE |
Title |
| IEC PAS 62175:2000 (2000-08) |
MARKING PERMANENCY TEST METHOD |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
21.00 €
|
5. |
Description
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-08-24 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-08-24 |
| IEC last modification date |
2009-08-18 |
|
