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Publication details

Publication CODE Title
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV (2002-04) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
 
Price Excl. VAT Total number of pages, tables and drawings
731.00 € 151.
Description
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Partly replaced by  IEC 60749-25:2003
Partly replaced by  IEC 60749-7:2002
Partly replaced by  IEC 60749-6:2002
Partly replaced by  IEC 60749-5:2003
Partly replaced by  IEC 60749-4:2002
Partly replaced by  IEC 60749-3:2002
Partly replaced by  IEC 60749-21:2004
Partly replaced by  IEC 60749-20:2002
Partly replaced by  IEC 60749-15:2003
Partly replaced by  IEC 60749-8:2002
Partly replaced by  IEC 60749-36:2003
Partly replaced by  IEC 60749-9:2002
Partly replaced by  IEC 60749-31:2002
Partly replaced by  IEC 60749-1:2002
Partly replaced by  IEC 60749-24:2004
Partly replaced by  IEC 60749-22:2002
Partly replaced by  IEC 60749-2:2002
Partly replaced by  IEC 60749-19:2003
Partly replaced by  IEC 60749-14:2003
Partly replaced by  IEC 60749-13:2002
Partly replaced by  IEC 60749-12:2002
Partly replaced by  IEC 60749-11:2002
Partly replaced by  IEC 60749-10:2002
Partly replaced by  IEC 60749-32:2002
Replaced by  IEC 60749-36:2003
Replaced by  IEC 60749-32:2002
Replaced by  IEC 60749-25:2003
Replaced by  IEC 60749-24:2004
Replaced by  IEC 60749-22:2002
Replaced by  IEC 60749-21:2004
Replaced by  IEC 60749-20:2002
Replaced by  IEC 60749-19:2003
Replaced by  IEC 60749-15:2003
Replaced by  IEC 60749-14:2003
Replaced by  IEC 60749-13:2002
Replaced by  IEC 60749-12:2002
Replaced by  IEC 60749-11:2002
Replaced by  IEC 60749-10:2002
Replaced by  IEC 60749-9:2002
Replaced by  IEC 60749-8:2002
Replaced by  IEC 60749-7:2002
Replaced by  IEC 60749-6:2002
Replaced by  IEC 60749-5:2003
Replaced by  IEC 60749-4:2002
Replaced by  IEC 60749-3:2002
Replaced by  IEC 60749-2:2002
Replaced by  IEC 60749-1:2002
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2002-04-10
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
IEC publication date 2002-04-10
IEC last modification date 2017-08-23