| Publication CODE |
Title |
| IEC 60749-17:2003 (2003-02) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
21.00 €
|
11. |
Description
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2003-02-20 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2003-02-20 |
| IEC stability date |
2020-12-31 |
| IEC last modification date |
2003-04-02 |
|
