Publication CODE |
Title |
IEC PAS 62185:2000 (2000-08) |
THERMAL SHOCK TEST METHOD |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
21.00 €
|
7. |
Description
This test is conducted to determine the resistance of a part to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes.
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Status |
IEC PUBLICATION |
Situation |
Withdrawn
|
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2000-08-22 |
ICS-Code (International Standards Classification) |
35.040
|
NBN Status |
New |
|
IEC publication date |
2000-08-22 |
IEC last modification date |
2009-08-18 |
|