Publication details

Publication CODE	Title
IEC 60747-5-3:1997 (1997-09)	DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS

Price Excl. VAT	Total number of pages, tables and drawings
249.00 €	61.

Description Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
Class	C990 (IEC PUBLICATIONS IEC PUBLICATIONS)

Available files

EN/FR version

Status

IEC PUBLICATION

Situation

Withdrawn
Partly replaced by IEC 60747-5-4:2006
Partly replaced by IEC 60747-5-6:2016
Partly replaced by IEC 60747-5-5:2007
Partly replaced by IEC 60747-5-7:2016
Replaced by IEC 60747-5-4:2006
Replaced by IEC 60747-5-5:2007
Replaced by IEC 60747-5-7:2016
Replaced by IEC 60747-5-6:2016
Partly replaces IEC 60747-5:1992
Partly replaces IEC 60747-5:1992/AMD1:1994
Partly replaces IEC 60747-5:1992/AMD2:1995

Origin

Committee	TC 47/SC 47E DISCRETE SEMICONDUCTOR DEVICES
Responsible	Ir DELENS Marc

Approval

BEC Approval	1997-09-05
ICS-Code (International Standards Classification)	31.260

IEC publication date	1997-09-05
IEC stability date	2013-12-31
IEC last modification date	2017-08-23