Account:  - Login  |  Webstore  |  Shopping basket cart
English  |  Français  |  Nederlands

Publication details

Publication CODE Title
IEC 63202-1:2019 (2019-06) PHOTOVOLTAIC CELLS - PART 1: MEASUREMENT OF LIGHT-INDUCED DEGRADATION OF CRYSTALLINE SILICON PHOTOVOLTAIC CELLS
 
Price Excl. VAT Total number of pages, tables and drawings
42.00 € 17.
Description
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
Responsible De heer VAN HECKE Luk
Approval
BEC Approval 2019-06-20
ICS-Code (International Standards Classification) 27.160
NBN Status New
IEC publication date 2019-06-20
IEC stability date 2021-12-31
IEC file modification date 2019-06-20
IEC last modification date 2019-06-20