| Publication CODE |
Title |
| IEC 60759:1983 (1983-01) |
STANDARD TEST PROCEDURES FOR SEMICONDUCTOR X-RAY ENERGY SPECTROMETERS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
286.00 €
|
97. |
Description
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 45
NUCLEAR INSTRUMENTATION
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
1983-01-01 |
| ICS-Code (International Standards Classification) |
17.240
|
|
| IEC publication date |
1983-01-01 |
| IEC stability date |
2024-12-31 |
| IEC last modification date |
2020-07-09 |
|
