| Publication CODE |
Title |
| IEC TR 63357:2022 (2022-10) |
SEMICONDUCTOR DEVICES - STANDARDIZATION ROADMAP OF FAULT TEST METHOD FOR AUTOMOTIVE VEHICLES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
14. |
Description
IEC TR 63357:2022(E) describes standardization roadmap of fault test methods for integrated circuits used in automotive vehicles. Since automotive vehicles are exposed in harsh environment such as very low or high temperature, vibration, high frequency signals, etc. Therefore, they are tested for possible faults which can be caused by harsh environment. There are several fault test methods and related issues to be standardized.
Semiconductor devices used in automotive vehicles are exposed in harsh environment of very high or very low temperature, vibration, high frequency signals, etc. Therefore, they are tested for possible faults which can be caused by harsh environment Evaluation results following this fault test methods will provide robustness of the semiconductor device.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2022-10-11 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2022-10-11 |
| IEC stability date |
2025-12-31 |
| IEC file modification date |
2022-10-11 |
| IEC last modification date |
2022-10-11 |
|
