| Publication CODE |
Title |
| IEC 62951-6:2019 (2019-05) |
SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 6: TEST METHOD FOR SHEET RESISTANCE OF FLEXIBLE CONDUCTING FILMS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
50. |
Description
IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2019-05-06 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2019-05-06 |
| IEC stability date |
2023-12-31 |
| IEC file modification date |
2019-05-06 |
| IEC last modification date |
2019-05-22 |
|
