| Publication CODE |
Title |
| IEC 60749-29:2003 (2003-11) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
41. |
Description
Covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2003-11-04 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2003-11-04 |
| IEC last modification date |
2011-04-07 |
|
